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Proceedings Paper

Light scattering in a thin-film waveguide and surface-roughness statistical characteristic determination
Author(s): A. N. Osovitsky; A. P. Tcheliev; Igor Vasilievic Tcheremiskin
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Paper Abstract

The problem of the waveguided light energy loss, due to irregularities of the surfaces, was raised in the very first works on planar optics. Later, the light scattering on irregularities of thin-film waveguides (TW) was discussed by a number of authors. There are two approaches to the problem: attenuation coefficient, and scattering diagram (SD), etc., -- direct problem and characterization of surface roughness statistical parameters with the help of recorded scattering diagram -- inverse problem. Here we discuss the works performed at the Department of Radiophysics of the People's Friendship University since 1963, mainly those that deal with the light scattering on irregularities of TW and the characterization of the surface roughness.

Paper Details

Date Published: 14 May 1993
PDF: 37 pages
Proc. SPIE 1932, Guided-Wave Optics, (14 May 1993); doi: 10.1117/12.145592
Show Author Affiliations
A. N. Osovitsky, People's Friendship Univ. (Russia)
A. P. Tcheliev, People's Friendship Univ. (Russia)
Igor Vasilievic Tcheremiskin, People's Friendship Univ. (Russia)


Published in SPIE Proceedings Vol. 1932:
Guided-Wave Optics

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