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Proceedings Paper

Integration of ESPI and structural analysis to determine the impact of structural defects
Author(s): Gabriel V. Garcia; Larryl K. Matthews; L. M. Hickman
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Paper Abstract

The identification of a defect and the ability to determine its impact on the structure provides the information needed to determine the resulting integrity of the structure. Electronic Speckle Pattern Interferometry (ESPI) is used to help find defects. One shortcoming of ESPI is the inability to determine the impact of the defect on the overall structural integrity. Displacement and strain data from ESPI measurements can be used to determine the parameters of a structure, thus providing a quantifiable means of determining the structural integrity. Parameter estimation techniques provide the means to bring ESPI data and structural models together. An example of the integration of parameter estimation and ESPI displacement output on a fixed-free supported beam will be discussed in this paper.

Paper Details

Date Published: 28 May 1993
PDF: 8 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145576
Show Author Affiliations
Gabriel V. Garcia, New Mexico State Univ. (United States)
Larryl K. Matthews, New Mexico State Univ. (United States)
L. M. Hickman, New Mexico State Univ. (United States)


Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

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