Share Email Print
cover

Proceedings Paper

Phase-stepping DSPI and its applications
Author(s): Wen Zheng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of phase-stepping technique in speckle interferometry allows a quantitative evaluation of the interference phase with high accuracy and offers the possibility of automated interferogram processing. In this paper, an automated measuring system based on this technique is described. The effects of system parameters on the phase extraction are discussed, some applications in the fields of transient event analysis, in-plane deformation measurement, vibration analysis and nondestructive testing are presented.

Paper Details

Date Published: 28 May 1993
PDF: 8 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145574
Show Author Affiliations
Wen Zheng, Guangzhou Univ. (China)


Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top