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Proceedings Paper

Electronic speckle pattern interferometry with holo-optical element
Author(s): Nandigana K. Krishna Mohan; Prafulla J. Masalkar; Rajpal S. Sirohi
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Paper Details

Date Published: 28 May 1993
PDF: 9 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145541
Show Author Affiliations
Nandigana K. Krishna Mohan, Indian Institute of Technology/Madras (India)
Prafulla J. Masalkar, Indian Institute of Technology/Madras (Japan)
Rajpal S. Sirohi, Indian Institute of Technology/Madras (India)


Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

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