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Proceedings Paper

Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry
Author(s): Gerd Guelker; Klaus D. Hinsch; Claudia Hoelscher
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Paper Abstract

Electronic speckle pattern interferometry is elaborated in such a way that also spatially resolved image decorrelation can be measured. While retaining the typical ESPI setup for deformation measurements, a speckle correlation formalism is implemented based on the phase-shift method. In many practical situations decorrelation is directly related to surface microstructure changes of a test specimen. Feasibility and restrictions of the method are illustrated by measurements of water-induced changes at the surfaces of natural stones and by monitoring microbiological activity on stones.

Paper Details

Date Published: 28 May 1993
PDF: 10 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145538
Show Author Affiliations
Gerd Guelker, Univ. Oldenburg (Germany)
Klaus D. Hinsch, Univ. Oldenburg (Germany)
Claudia Hoelscher, Univ. Oldenburg (Germany)


Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

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