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Proceedings Paper

Gloss-related surface topography visualized with the scanning electron microscope
Author(s): Lois A. Settlemeyer
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Paper Abstract

The scanning electron microscope (SEM) has long been recognized as a tool to give a visual image of a surface. Because of the SEM's wide magnification range both macro and micro structure can be recorded. A method which uses the SEM to record topography and provide an understanding of surface structure is described in this paper. This method is especially useful when surface gloss measurement tools do not agree with visual perception. High gloss, depth of gloss, or icy gloss are better visualized with this new procedure. A review of how macro and micro structure effects gloss, how typical gloss measurement tools can be misleading, and how the human eye differs in its perception from these tools will be made. Normal SEM operation optimizes for resolution, whereas the new method sets the sample angle to be the complement of the gloss measurement tool angle. Photomicrographs will highlight the advantages the new SEM method offers.

Paper Details

Date Published: 28 May 1993
PDF: 10 pages
Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145535
Show Author Affiliations
Lois A. Settlemeyer, Dow Chemical Co. (United States)

Published in SPIE Proceedings Vol. 1821:
Industrial Applications of Optical Inspection, Metrology, and Sensing
Gordon M. Brown; Kevin G. Harding; H. Philip Stahl, Editor(s)

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