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Proceedings Paper

Syracuse Research Corporation (SRC) ultrawide-bandwidth measurements radar
Author(s): Peter M. Rankin; Robert F. Wallenberg
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Paper Abstract

In recent years, Syracuse Research Corporation has implemented bandwidth expansion and extended coherent processing techniques to improve scatterer resolution of images derived from existing data. The algorithms can produce extraneous responses, however, which is not the case if the data is collected using an ultrawide bandwidth radar. The long and continuous effort in radar imaging at SRC and the limited number and availability of wideband sensors justified the development of an in-house imaging facility that would be available on demand. As a result, the SRC Ultrawide Bandwidth Measurements Radar was assembled to perform the required measurements of the radar cross section (RCS) of isolated scatterers and to determine their relative location on a wide variety of target types. Along with the use of radar images for target analysis has been the development of target modeling algorithms and software that accurately predict the electromagnetic scattering from complex objects. A few years ago, the software was expanded to model objects as viewed in wide angle bistatic configurations. The SRC radar was utilized to validate these modeling algorithms in several radar bands at large bistatic angles. The system has subsequently been employed to measure a variety of target models and complex shapes and to evaluate the effects of radar absorbing materials (RAMs).

Paper Details

Date Published: 28 May 1993
PDF: 11 pages
Proc. SPIE 1875, Ultrahigh Resolution Radar, (28 May 1993); doi: 10.1117/12.145527
Show Author Affiliations
Peter M. Rankin, Syracuse Research Corp. (United States)
Robert F. Wallenberg, Syracuse Research Corp. (United States)


Published in SPIE Proceedings Vol. 1875:
Ultrahigh Resolution Radar
Roger S. Vickers, Editor(s)

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