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Proceedings Paper

Specifications for the development of a 3D visual inspection/diagnosis system for damaged VLSI boards: VLSI reverse engineering
Author(s): Ali Moghaddamzadeh; Nikolaos G. Bourbakis
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Paper Details

Date Published: 6 May 1993
PDF: 9 pages
Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993); doi: 10.1117/12.144801
Show Author Affiliations
Ali Moghaddamzadeh, SUNY/Binghamton (United States)
Nikolaos G. Bourbakis, SUNY/Binghamton (United States)


Published in SPIE Proceedings Vol. 1907:
Machine Vision Applications in Industrial Inspection
Frederick Y. Wu; Benjamin M. Dawson, Editor(s)

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