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Proceedings Paper

Comparison of Si P-I-N diodes and thermoluminescent detector responses in the soft x-ray region
Author(s): Josef Krasa; M. Pietrikova; Libor Juha; Milos Chvojka; Bozena Kralikova; Karel Masek; Jiri Skala; E. Krousky; J. Trousil; J. Plichta; Anita Darickova
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Paper Abstract

Comparative measurements of Si P-I-N diodes and thermoluminescent dosemeters responses to laser produced plasma soft x-ray radiation are reported. As dosemeters single crystals LiF:Mn,Ti TLD 100 and CaF2:Dy TLD 200 were used. It is demonstrated that an enhanced response of the Si P-I-N diodes is a significant effect in a region of high dose rates.

Paper Details

Date Published: 23 April 1993
PDF: 6 pages
Proc. SPIE 1980, Iodine Lasers and Applications, (23 April 1993); doi: 10.1117/12.144508
Show Author Affiliations
Josef Krasa, Institute of Physics (Czech Republic)
M. Pietrikova, Institute of Physics (Czech Republic)
Libor Juha, Institute of Physics (Czech Republic)
Milos Chvojka, Institute of Physics (Czech Republic)
Bozena Kralikova, Institute of Physics (Czech Republic)
Karel Masek, Institute of Physics (Czech Republic)
Jiri Skala, Institute of Physics (Czech Republic)
E. Krousky, Institute of Physics (Czech Republic)
J. Trousil, National Personal Dosimetry Service (Czech Republic)
J. Plichta, National Personal Dosimetry Service (Czech Republic)
Anita Darickova, Technical Univ. (Czech Republic)

Published in SPIE Proceedings Vol. 1980:
Iodine Lasers and Applications
Milos Chvojka; Jarmila Kodymova; Bozena Kralikova, Editor(s)

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