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Proceedings Paper

Comparison between measured results and true spectrum from a semiconductor amplifier with AR coatings
Author(s): Lan Wu; Bin Luo; Jianguo Chen; Yucun Lu
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Paper Abstract

The experimental value of the modal reflectivity of a semiconductor amplifier with AR coatings determined from the recorded spontaneous emission spectrum changes with the passband width of the grating monochromator used. It is found that the measured reflectivity becomes smaller as the passband width becomes larger, and takes its minimum periodically when the passband width is equal to multiples of the mode spacing of the diode. Under certain circumstances the measured value may be orders of magnitude different from the true reflectivity. In order to achieve a reliable measurement, the passband width should be kept less than 1/5 of the mode spacing of the diode.

Paper Details

Date Published: 11 May 1993
PDF: 6 pages
Proc. SPIE 1979, 1992 International Conference on Lasers and Optoelectronics, (11 May 1993); doi: 10.1117/12.144152
Show Author Affiliations
Lan Wu, Sichuan Univ. (China)
Bin Luo, Sichuan Univ. (China)
Jianguo Chen, Sichuan Univ. (China)
Yucun Lu, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 1979:
1992 International Conference on Lasers and Optoelectronics

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