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Proceedings Paper

Grain velocity measurement using a linear image sensor
Author(s): Changhe Chen; Michael F. Kocher; David D. Jones
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Paper Abstract

A metal-oxide semiconductor (MOS) linear image sensor consisting of an array of 128 self- scanning, linear photodiodes was used to measure the velocity of falling grain. The sensor was used to obtain an image of the falling grain wait a known time interval and then obtain a second image. Comparison of the two images permitted determination of the position displacement experienced by the grain. Optical relationships were used to convert the image displacement to grain displacement. Grain displacement divided by the time interval yielded grain velocity. This paper addresses the sensor and data acquisition hardware, the digital signal processing software, and calibration of the sensor.

Paper Details

Date Published: 12 May 1993
PDF: 8 pages
Proc. SPIE 1836, Optics in Agriculture and Forestry, (12 May 1993); doi: 10.1117/12.144022
Show Author Affiliations
Changhe Chen, Univ. of Nebraska/Lincoln (United States)
Michael F. Kocher, Univ. of Nebraska/Lincoln (United States)
David D. Jones, Univ. of Nebraska/Lincoln (United States)


Published in SPIE Proceedings Vol. 1836:
Optics in Agriculture and Forestry
James A. DeShazer; George E. Meyer, Editor(s)

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