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Proceedings Paper

Machine recognition of weevil damage in wheat radiographs
Author(s): Pamela M. Keagy; Thomas F. Schatzki
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Paper Abstract

An image processing algorithm has been developed for machine recognition of weevils and/or weevil damage in film x-ray images of wheat kernels [8 bits, (0.25 mm)2/pixel]. The 8 bit grey scale image is converted to a binary image of interior edges and lines using a Laplacian mask, zero threshold, and background removal. In undamaged kernels the predominant feature of this image is a line representing the central crease of the kernel. In insect-damaged kernels this feature is disrupted and additional edges or lines are seen at angles to the crease. The algorithm uses convolution masks to look for intersections (45 or 90 degree angles with 4 or 5 pixel length sides) at 8 orientations. Recognition varies with insect stage; at least 50% of infested kernels are machine recognized by the 4th instar (26 - 28 days). This is comparable to 50% recognition by humans at 25.5 days for images of similar resolution. False positive responses are limited to 0.5%.

Paper Details

Date Published: 12 May 1993
PDF: 12 pages
Proc. SPIE 1836, Optics in Agriculture and Forestry, (12 May 1993); doi: 10.1117/12.144020
Show Author Affiliations
Pamela M. Keagy, USDA Agricultural Research Service (United States)
Thomas F. Schatzki, USDA Agricultural Research Service (United States)

Published in SPIE Proceedings Vol. 1836:
Optics in Agriculture and Forestry
James A. DeShazer; George E. Meyer, Editor(s)

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