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Proceedings Paper

Frequency standards at 1.523 μm based on 20Ne and at 1.56 μm derived from the 0.780 μm Rb frequency standard
Author(s): David J. Knight; K. I. Pharaoh; Geoffrey P. Barwood; David A. Humphreys; Christopher J. Hodges; Martin Lawrence; Keith H. Cameron
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Paper Abstract

This paper reports experimental work towards a laboratory standard based on the 20Ne transition at 1.523 micrometers , some calibration measurements to 2.5 parts in 107 on lines of C2H2 between 1.52 and 1.545 micrometers , and investigation of a standard at 1.56 micrometers involving a CO line. Progress is described towards measurement of the latter line by frequency doubling to, and beating against, a Rb D2-line stabilized laser at 0.780 micrometers of known frequency.

Paper Details

Date Published: 30 April 1993
PDF: 9 pages
Proc. SPIE 1837, Frequency-Stabilized Lasers and Their Applications, (30 April 1993); doi: 10.1117/12.143665
Show Author Affiliations
David J. Knight, National Physical Lab. (United Kingdom)
K. I. Pharaoh, National Physical Lab. (United Kingdom)
Geoffrey P. Barwood, National Physical Lab. (United Kingdom)
David A. Humphreys, National Physical Lab. (United Kingdom)
Christopher J. Hodges, Univ. of Cambridge (United Kingdom)
Martin Lawrence, BT&D Technologies (United Kingdom)
Keith H. Cameron, British Telecom Labs. (United Kingdom)

Published in SPIE Proceedings Vol. 1837:
Frequency-Stabilized Lasers and Their Applications
Y. C. Chung, Editor(s)

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