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Proceedings Paper

High-speed pattern recognition system
Author(s): J. Peter Rosenfeld; R. Michael Hord
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Paper Abstract

We have developed a binary pattern matching system for the recognition of segmented logos and icons corrupted by random and correlated noise. It is based on the POLCAR transform. The POLCAR transform is invariant to pattern translation and converts size and orientation changes into translations. It has a high pattern discrimination ability, requires no training, and should be capable of running in real-time. The initial tests of this system are very encouraging.

Paper Details

Date Published: 13 April 1993
PDF: 12 pages
Proc. SPIE 1838, 21st AIPR Workshop on Interdisciplinary Computer Vision: An Exploration of Diverse Applications, (13 April 1993); doi: 10.1117/12.142790
Show Author Affiliations
J. Peter Rosenfeld, GE Advanced Technology Labs. (United States)
R. Michael Hord, GE Advanced Technology Labs. (United States)


Published in SPIE Proceedings Vol. 1838:
21st AIPR Workshop on Interdisciplinary Computer Vision: An Exploration of Diverse Applications

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