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Proceedings Paper

Electron scrubbing of microchannel plates
Author(s): Xuhui Zhou; Shicai Liu; D. Chen; Zonghe Xu
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Paper Abstract

In this paper the electron scrubbing and life tests for microchannel plates used in second generation image intensifiers are studied. It presents the test apparatus developed specially for such tests and inquires into the proper schemes for the scrubbing process. Test results are analyzed and relevant conclusions drawn.

Paper Details

Date Published: 1 April 1993
PDF: 4 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142072
Show Author Affiliations
Xuhui Zhou, East China Institute of Technology (China)
Shicai Liu, East China Institute of Technology (China)
D. Chen, East China Institute of Technology (China)
Zonghe Xu, East China Institute of Technology (China)


Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93

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