Share Email Print
cover

Proceedings Paper

New technology and measurement of L2MCP
Author(s): Lichen Fu; Jingquan Tian; Baifu Zhang; Delong Jing; Kui Wu; Yaohua Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes the characteristics of long life microchannel plate (L2MCP), analyzes the reason why the lifetime of common MCP becomes short, gives the principle and technique of the new method which can lengthen the operating lifetime of MCP, and introduces an electron scrubbing experiment, UV-photoelectric testing method, and the results. Finally, the advantage and the application prospect of the technology are pointed out.

Paper Details

Date Published: 1 April 1993
PDF: 6 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142070
Show Author Affiliations
Lichen Fu, Changchun Institute of Optics and Fine Mechanics (China)
Jingquan Tian, Changchun Institute of Optics and Fine Mechanics (China)
Baifu Zhang, Changchun Institute of Optics and Fine Mechanics (China)
Delong Jing, Changchun Institute of Optics and Fine Mechanics (China)
Kui Wu, Changchun Institute of Optics and Fine Mechanics (China)
Yaohua Lu, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93

© SPIE. Terms of Use
Back to Top