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Proceedings Paper

Single-mode fiber optic in electronic speckle pattern interferometry
Author(s): Wei Liu; Yushan Tan; Xianglin Wang; Haitao Wang; Lijun Jiang
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Paper Abstract

A new technique has been developed for applying fiber optics to electronic speckle pattern interferometry (ESPI) to measure unbonded faults in the carbon/epoxy honeycomb composite. The fiberized ESPI system we designed is introduced in detail. This paper also develops the theoretical and experimental approach of singlemode fiber optics phase-step ESPI. This approach produces a significant improvement in fringe contrast and in reducing image processing computational effort. We adapted the singlemode fiber piezoelectric transducer as modulator and the two-step phase shifting method.

Paper Details

Date Published: 1 April 1993
PDF: 8 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142068
Show Author Affiliations
Wei Liu, Xi'an Jiaotong Univ. (China)
Yushan Tan, Xi'an Jiaotong Univ. (China)
Xianglin Wang, Xi'an Jiaotong Univ. (China)
Haitao Wang, Xi'an Jiaotong Univ. (China)
Lijun Jiang, Xi'an Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93
LiWei Zhou, Editor(s)

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