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Proceedings Paper

Measurement system for scanner angular linearity
Author(s): Li Wang; Haochen Liang; Wei-Li Qiu
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Paper Abstract

This paper describes a measurement system for scanner linearity of angle vs. time. Because the techniques of pinhole filter, high-speed data acquisition, and CCD elaborate division have been successfully used, the system has a high measurement accuracy (2 micrometers ) and powerful data processing capacity.

Paper Details

Date Published: 1 April 1993
PDF: 7 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142035
Show Author Affiliations
Li Wang, Institute No. 207 of the Second Academy (China)
Haochen Liang, Institute No. 207 of the Second Academy (China)
Wei-Li Qiu, Institute No. 207 of the Second Academy (China)


Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93

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