Share Email Print
cover

Proceedings Paper

Photoelectronic detection of optical surface defects of optical system
Author(s): Shou-Cheng Cheng; Fu Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper introduces an auto-photoelectronic instrument for evaluating the surface defects of the optical parts inside an optical instrument. By analyzing the effects of defects on image quality, we can present the possibility of evaluating the surface defects and its damage objectively and quantitatively by measuring stray-light. Detailed discussion is given about the physical procedure for generating and measuring stray-light. On the basis of this theoretical research a new type of auto-photoelectronic instrument used to evaluate the defects on the optical surface inside the optical system is given. In this instrument the technology of photoelectronics and microcomputer is applied, so a test result is given automatically.

Paper Details

Date Published: 1 April 1993
PDF: 5 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142032
Show Author Affiliations
Shou-Cheng Cheng, Ordnance Engineering College (China)
Fu Wang, Ordnance Engineering College (China)


Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93

© SPIE. Terms of Use
Back to Top