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Proceedings Paper

Analyzing the thermal stability of CsI photocathodes with XPS
Author(s): Kaisheng Tan; Zhiyong Pan; Fengqin Liu
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Paper Abstract

The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with x- ray photoelectron spectroscopy (XPS) in this paper. The experimental results indicate that when the vacuum-baking temperature is below 180 degree(s)C the chemical states of CsI photocathode are stable, but there is a sublimation of CsI with low rate in high vacuum. When the vacuum-baking temperature is higher than 180 degree(s)C, chemical shifts will occur.

Paper Details

Date Published: 1 April 1993
PDF: 5 pages
Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142008
Show Author Affiliations
Kaisheng Tan, Institute of Electronics (China)
Zhiyong Pan, Institute of Electronics (China)
Fengqin Liu, Institute of High Energy Physics (China)

Published in SPIE Proceedings Vol. 1982:
Photoelectronic Detection and Imaging: Technology and Applications '93
LiWei Zhou, Editor(s)

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