Share Email Print

Proceedings Paper

Single-event test methodology for integrated optoelectronics
Author(s): Kenneth A. LaBel; James Alford Cooley; E. G. Stassinopoulos; Paul W. Marshall; Christina M. Crabtree
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

As spacecraft require lighter weight and higher speed communication systems, technologies such as fiber optics have come to the forefront. The space radiation environment, however, can be quite harsh in its effects on a fiber optic system. This paper presents the methodology behind testing integrated optoelectronic receivers and transmitters for single event upsets (SEUs). Two main causes of single event effects in the space environment are discussed, namely protons (trapped and solar flare) and galactic cosmic rays, as well as ground test facilities used to simulate the space environment. The prime emphasis presented herein is on the actual test requirements and system schemes needed for devices such as integrated optoelectronics. The definition of an SEU is unique to each fiber optic system application: a setup that is capable of detecting small signal 'glitches' may not be realistic when the interface circuitry utilizes an overlying system protocol or sampling scheme. Additionally, the expected system utilization rates may also affect the SEU rates. Actual test data and applications are discussed.

Paper Details

Date Published: 6 April 1993
PDF: 9 pages
Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993); doi: 10.1117/12.141888
Show Author Affiliations
Kenneth A. LaBel, NASA Goddard Space Flight Ctr. (United States)
James Alford Cooley, NASA Goddard Space Flight Ctr. (United States)
E. G. Stassinopoulos, NASA Goddard Space Flight Ctr. (United States)
Paul W. Marshall, SFA, Inc. (United States)
Christina M. Crabtree, Hughes STX (United States)

Published in SPIE Proceedings Vol. 1794:
Integrated Optical Circuits II
Ka-Kha Wong, Editor(s)

© SPIE. Terms of Use
Back to Top