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Proceedings Paper

Review of the status of LiNbO3 devices and technologies
Author(s): Hiroshi Mori; Akio Watanabe; Takumi Fujiwara
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Paper Abstract

In this paper, we review LiNbO3-based devices and technologies from both materials and device processing techniques. However, all the relevant areas cannot possibly be covered; we limit the scope of the paper to electrooptic devices. Also, we mostly focus on our own activities at Sumitomo Metal Mining. First, materials-related issues such as the uniformity and consistency of the substrate crystal as assessed by the variability of directional coupler coupling length are summarized. The photorefractive damage resistance is also reviewed; the dependence on the substrate quality and input laser wavelength. Second, taking the case of the multi-function gyro chip, we review and discuss the use of both Ti-indiffused and proton- exchanged waveguides on a single chip.

Paper Details

Date Published: 6 April 1993
PDF: 9 pages
Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993); doi: 10.1117/12.141874
Show Author Affiliations
Hiroshi Mori, Sumitomo Metal Mining Co., Ltd. (Japan)
Akio Watanabe, Sumitomo Metal Mining Co., Ltd. (Japan)
Takumi Fujiwara, Sumitomo Metal Mining Co., Ltd. (Japan) and Univ. of Florida (Japan)


Published in SPIE Proceedings Vol. 1794:
Integrated Optical Circuits II
Ka-Kha Wong, Editor(s)

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