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Proceedings Paper

High-resolution optical fiber reflectometry techniques
Author(s): Wayne V. Sorin
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Paper Abstract

This paper reviews optical reflectometry techniques that are capable of achieving spatial resolutions of less than 1 cm. Advantages and disadvantages of these techniques are discussed. A white light interferometry technique known as optical low-coherence reflectometry is emphasized. This technique has been used to obtain spatial resolutions on the order of tens of microns and reflection sensitivities as low as -148 dB.

Paper Details

Date Published: 5 March 1993
PDF: 10 pages
Proc. SPIE 1797, Distributed and Multiplexed Fiber Optic Sensors II, (5 March 1993); doi: 10.1117/12.141281
Show Author Affiliations
Wayne V. Sorin, Hewlett-Packard Labs. (United States)


Published in SPIE Proceedings Vol. 1797:
Distributed and Multiplexed Fiber Optic Sensors II
John P. Dakin; Alan D. Kersey, Editor(s)

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