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Proceedings Paper

Novel elements for optical and optoelectronic detection and signal processing using the current filament in semiconductors
Author(s): Oleg A. Ryabushkin; Vladimir A. Sablikov; Nikolay S. Platonov; Vladimir Antonovich Bader; V. I. Sergeyev; D. Yu. Babkin; Yu. A. Vlasjuk; D. V. Gridin
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Paper Abstract

A new family of optical and optoelectronic elements is offered whose operation is based on controlling the current filament in semiconductors having an S-shaped current-voltage characteristic (CVC). The current filament is controlled by the action of external fields (optical radiation, magnetic or electric field). The S-shaped CVC is a result of low- temperature impurity breakdown (LTIB) in semiconductor epitaxial layers induced by an electric field (E 1 - 10 V/cm). New elements, we shall call them LTIB-elements, possess a low specific dissipated power on the order of 10-9 W/micrometers 3. The characteristic time of current filament formation is about 10-9 s. For controlling the current filament an extremely low (several photons per square micrometer in the region of fundamental absorption) light intensity is sufficient. The filament control is possible in a band from UV to IR.

Paper Details

Date Published: 2 March 1993
PDF: 10 pages
Proc. SPIE 1793, Integrated Optics and Microstructures, (2 March 1993); doi: 10.1117/12.141223
Show Author Affiliations
Oleg A. Ryabushkin, Institute of Radio Engineering and Electronics (Russia)
Vladimir A. Sablikov, Institute of Radio Engineering and Electronics (Russia)
Nikolay S. Platonov, Institute of Radio Engineering and Electronics (Russia)
Vladimir Antonovich Bader, Institute of Radio Engineering and Electronics (Russia)
V. I. Sergeyev, Institute of Radio Engineering and Electronics (Russia)
D. Yu. Babkin, Institute of Radio Engineering and Electronics (Russia)
Yu. A. Vlasjuk, Institute of Radio Engineering and Electronics (Russia)
D. V. Gridin, Institute of Radio Engineering and Electronics (Russia)


Published in SPIE Proceedings Vol. 1793:
Integrated Optics and Microstructures
Massood Tabib-Azar; Dennis L. Polla, Editor(s)

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