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Proceedings Paper

Improved method for measuring fiber undercut and protrusion on PC polished connectors
Author(s): Eric A. Norland
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Paper Abstract

Fiber undercut and protrusion have been shown to play a key role in back reflection performance of pc polished connectors over temperature. End users are placing tolerances of +/-0.10 microns or less on the height differential between the fiber and the ferrule after polishing to get their performance requirements. Two methods for measuring this submicron height are compared, a stylus profilometer and an interference microscope. The surface profilometer provides an accurate two dimensional profile of the connector end face. The interferometric technique uses a tilt phase to provide information on the relation of the fiber to the ferrule surface that normally would not be seen. Advantages are shown in the three dimensional nature of the interferometric data which is ideal for measuring spherical surfaces and the simplicity and speed in which measurements can be made.

Paper Details

Date Published: 19 February 1993
PDF: 10 pages
Proc. SPIE 1792, Components for Fiber Optic Applications VII, (19 February 1993); doi: 10.1117/12.141203
Show Author Affiliations
Eric A. Norland, Norland Products Inc. (United States)

Published in SPIE Proceedings Vol. 1792:
Components for Fiber Optic Applications VII
Paul M. Kopera, Editor(s)

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