Share Email Print
cover

Proceedings Paper

Radiation effects on the components of optical LAN systems
Author(s): Alvin S. Kanofsky; Vladimir Gershman; Warren A. Rosen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have measured the effects of radiation on various optical LAN communication components. The measurements were performed with 2.5 MeV electrons from the Lehigh University Van de Graaff. The performance of the devices was monitored both during irradiation and after irradiation.

Paper Details

Date Published: 25 February 1993
PDF: 13 pages
Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); doi: 10.1117/12.141174
Show Author Affiliations
Alvin S. Kanofsky, Lehigh Univ. (United States)
Vladimir Gershman, Naval Air Development Ctr. (United States)
Warren A. Rosen, Naval Air Development Ctr. (United States)


Published in SPIE Proceedings Vol. 1791:
Optical Materials Reliability and Testing: Benign and Adverse Environments
Roger A. Greenwell; Dilip K. Paul, Editor(s)

© SPIE. Terms of Use
Back to Top