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Proceedings Paper

Gamma-ray vulnerability of light-emitting diodes, injection-laser diodes, and pin photodiodes for 1.3-um-wavelength fiber optics
Author(s): Gerard Breuze; Jean Serre
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Paper Abstract

With the increasing use of optical data links it becomes essential to test for radiation vulnerability not only the transmission support--fiber and cable--but also fiber-end electro- optical components that could be exposed to hostile environment. Numerous silica-based fibers were currently tested over the world. This paper gives a comparison of radiation resistance between two gradient index multimode fibers with and without phosphor in core. From that result a technological change in standard 1.3 micrometers wavelength light-emitting diodes (LEDs), injection-laser diodes (LDs) and p-i-n photodiodes (PDs) was made. Results of tests under steady-state medium dose-rate Co60 exposure show a significant enhancement of improved components optical performance. Especially LED and PD present a small degradation of optical characteristics for 50 kGy (for a dose-rate of about a few 10 Gy h-1). Multicomponent laser-diode modules (LDM) were extensively tested up to about 20 kGy. Two degradation processes clearly appear: a wrong decrease of stimulated light emission after 3 - 4 kGy and a bad operation of thermoelectric element cooler beyond about 10 kGy. Hardened optical data links are now able to withstand successfully some nuclear environments.

Paper Details

Date Published: 25 February 1993
PDF: 10 pages
Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); doi: 10.1117/12.141168
Show Author Affiliations
Gerard Breuze, LETI/CEA (France)
Jean Serre, LETI/CEA (France)

Published in SPIE Proceedings Vol. 1791:
Optical Materials Reliability and Testing: Benign and Adverse Environments
Roger A. Greenwell; Dilip K. Paul, Editor(s)

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