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Proceedings Paper

Radiation response of 1300-nm optoelectronic components in a natural space environment
Author(s): Cheryl J. Dale; Paul W. Marshall
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Paper Abstract

We report energy-dependent proton and Co-60 test results and analysis assessing performance of In0.53Ga0.47As photodetectors and In0.71Ga0.29As0.61P0.39 laser diodes for satellite applications. Calculations of the nonionizing energy loss (NIEL) for protons in InGaAs allow damage assessment using a general technique for evaluating displacement damage in orbit. Device performance is predicted for several shield thicknesses and orbital conditions. We also discuss effects in optoelectronic devices due to total dose and ionization transients.

Paper Details

Date Published: 25 February 1993
PDF: 8 pages
Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); doi: 10.1117/12.141165
Show Author Affiliations
Cheryl J. Dale, Naval Research Lab. (United States)
Paul W. Marshall, Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 1791:
Optical Materials Reliability and Testing: Benign and Adverse Environments
Roger A. Greenwell; Dilip K. Paul, Editor(s)

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