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Proceedings Paper

New viewpoint on the synthesis of thin films using Fourier transforms
Author(s): Ronald R. Willey
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Paper Abstract

Previously published works on the use of Fourier transforms to synthesize thin film designs have mentioned two problems. One has been a lack of a relational function of reflectance to the index profile, or `Q-function,' which gives satisfactory results for both high and low reflectance cases. The other is that the reflectance versus frequency profiles of well known results, from the matrix approach, showed a significant distortion for high reflectors. Our investigations have concluded that the transform of the simple reflectance amplitude versus optical thickness gives correct results in reflectance versus frequency for all cases when multiple reflections are properly taken into account. The limitation of using only non- dispersive and non-absorbing media still applies to this work. The challenging antireflection coating problem posed for this meeting (a 400 to 900 nm bandwidth and less than 1% reflectance from 0 to 30 degrees) is used as an example to see what insight may be gained by the use of Fourier and related viewpoints.

Paper Details

Date Published: 4 March 1993
PDF: 12 pages
Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); doi: 10.1117/12.141052
Show Author Affiliations
Ronald R. Willey, Opto Mechanik, Inc. (United States)

Published in SPIE Proceedings Vol. 1782:
Thin Films for Optical Systems
Karl H. Guenther, Editor(s)

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