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Proceedings Paper

Modification of spectral characteristics of multilayer dielectric systems
Author(s): Ishtvan V. Fekeshgazi; Yury A. Pervak
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Paper Abstract

The relationship between the speotral responee oharacteristios of some two or three component dielectric systems and optical thicknesses and refractive indices of the layers are discussed. A solution of the problem of suppressing the high reflection zone at the fifth harmonic frequency, while maintaing high reflection at the operating frequency, is proposed for the non-equal thick two component multilayer system. Also are considered the characteristics of the three component systems ensuering high reflection on the operating wavelenght at a high transmittance in the broad spectral region including the frequency bands of the second and third haronics.

Paper Details

Date Published: 4 March 1993
PDF: 5 pages
Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); doi: 10.1117/12.141033
Show Author Affiliations
Ishtvan V. Fekeshgazi, Ukrainian Academy of Sciences (Ukraine)
Yury A. Pervak, Ukrainian Academy of Sciences (Ukraine)

Published in SPIE Proceedings Vol. 1782:
Thin Films for Optical Systems
Karl H. Guenther, Editor(s)

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