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Proceedings Paper

Low absorption measurements of optical thin films at 10.6 microns
Author(s): Jean DiJon; Erik Duloisy; Philippe Lyan
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Paper Abstract

To extract the extinction coefficient k at 10.6 micrometers of thin films or bare substrates, we present new data analysis of photo thermal measurements. We successively show how to obtain k using analytical formulation taking into account substrate absorption and how to minimize experimental errors. Then we discuss accuracy and reliability for substrates, thin films, and mirrors. Results are given for k values as low as 10-4 for thin films, 10-8 for substrates, and mirror reflectivities higher than 99.8% have been measured.

Paper Details

Date Published: 4 March 1993
PDF: 12 pages
Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); doi: 10.1117/12.141012
Show Author Affiliations
Jean DiJon, CEA-LETI (France)
Erik Duloisy, CEA-LETI (France)
Philippe Lyan, CEA-LETI (France)

Published in SPIE Proceedings Vol. 1782:
Thin Films for Optical Systems

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