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Proceedings Paper

New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics
Author(s): Eric Toussaere; Joseph Zyss
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Paper Abstract

Ellipsometric spectra of thick polymer films for non-linear optics were recorded at several angles of incidence. A non-linear regression analysis is used to compare an isotropic model to a uniaxial one. Analysis in the transparent region unambiguously points out the more suitable model, and the corresponding thickness. These results are subsequently used on all the spectrum, including the absorption domains, so as to give the complex ordinary and extraordinary indices. Relevant structural information on the polymer conformation is then inferred.

Paper Details

Date Published: 4 March 1993
PDF: 8 pages
Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); doi: 10.1117/12.141009
Show Author Affiliations
Eric Toussaere, Ctr. National d'Etude des Telecommunications (France)
Joseph Zyss, Ctr. National d'Etude des Telecommunications (France)


Published in SPIE Proceedings Vol. 1782:
Thin Films for Optical Systems

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