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Proceedings Paper

Interferometric methods for the measurement of wavefront aberrations
Author(s): Ingolf Weingaertner; Michael Schulz
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Paper Abstract

The measurement of wavefront aberrations for optical imaging systems plays a major role in the field of modern optics. Measurements with a Fizeau type interferometer and a shearing type interferometer are described. The interferometric set-up for the shearing interferometer and the algorithms, in particular for the evaluation of the wavefront aberration, are described in more detail. Various methods for the measurement of wavefront aberrations are compared.

Paper Details

Date Published: 1 January 1993
PDF: 14 pages
Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140978
Show Author Affiliations
Ingolf Weingaertner, Physikalisch-Technische Bundesanstalt (Germany)
Michael Schulz, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 1781:
Specification and Measurement of Optical Systems

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