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Proceedings Paper

Testing aspherical surfaces using multiple annular interferograms
Author(s): Mauro Melozzi; Luis Pezzati; Alessandro Mazzoni
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Paper Abstract

We present a technique for interferometrically testing aspherical surfaces without the use of compensating elements. The method consists of recording successive overlapping phase maps from a set of annular interferograms of an aspherical surface, obtained using a conventional phase-shifting interferometer and a micropositioning translator stage. These maps are then sewn together with a suitable algorithm we have developed, and the whole surface error is recovered. Experimental results are shown to be in good agreement with the null lens test performed for comparison.

Paper Details

Date Published: 1 January 1993
PDF: 9 pages
Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140974
Show Author Affiliations
Mauro Melozzi, Officine Galileo SpA (Italy)
Luis Pezzati, Officine Galileo SpA (Italy)
Alessandro Mazzoni, Officine Galileo SpA (Italy)


Published in SPIE Proceedings Vol. 1781:
Specification and Measurement of Optical Systems

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