Share Email Print
cover

Proceedings Paper

Vector formulation for interferogram surface fitting
Author(s): David J. Fischer; John T. O'Bryan; H. Philip Stahl
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Interferometry is an optical testing technique based on the interference of light. Fringes are formed when the optical path difference (OPD) between a reference beam and an object beam is an integral multiple of the illuminating wavelength. This OPD is extracted through the process of sampling, ordering, and interpolating. This paper develops a linear-algebra vector notation model of the interferogram sampling and interpolation process.

Paper Details

Date Published: 2 September 1992
PDF: 8 pages
Proc. SPIE 1779, Optical Design and Processing Technologies and Applications, (2 September 1992); doi: 10.1117/12.140942
Show Author Affiliations
David J. Fischer, Rose-Hulman Institute of Technology (United States)
John T. O'Bryan, Rose-Hulman Institute of Technology (United States)
H. Philip Stahl, Rose-Hulman Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1779:
Optical Design and Processing Technologies and Applications

© SPIE. Terms of Use
Back to Top