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Proceedings Paper

Application of electro-optical holography to the measurement of strains at high temperatures
Author(s): Cesar A. Sciammarella; Gopalakrishna K. Bhat; Donald R. Matthys
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Paper Details

Date Published: 15 February 1993
PDF: 16 pages
Proc. SPIE 1756, Interferometry: Applications, (15 February 1993); doi: 10.1117/12.140817
Show Author Affiliations
Cesar A. Sciammarella, Illinois Institute of Technology (United States)
Gopalakrishna K. Bhat, Illinois Institute of Technology (United States)
Donald R. Matthys, Illinois Institute of Technology (United States)

Published in SPIE Proceedings Vol. 1756:
Interferometry: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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