Share Email Print

Proceedings Paper

Interferometer for measurement of absolute refractive index and thickness
Author(s): Serguei A. Alexandrov; Igor V. Chernyh
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The interferometer model for measurement of the absolute refractive index of the optical media with the accuracy of 0.00001 has been developed, manufactured and researched. The sample for test to be manufactured as the flat parallel plate. The interferometer gives possibility to defined sample geometrical thickness with accuracy 0.0002 mm simultaneously with index measurement. The range of index and thickness measurements is not limited in principle. The interferometer allows testing of solid, liquid and gaseous media.

Paper Details

Date Published: 15 February 1993
PDF: 6 pages
Proc. SPIE 1756, Interferometry: Applications, (15 February 1993); doi: 10.1117/12.140813
Show Author Affiliations
Serguei A. Alexandrov, Byelorussian Research Institute of Neurology, Neurosurgery and Phy (Belarus)
Igor V. Chernyh, Byelorussian Optical-Mechanical Union (Belarus)

Published in SPIE Proceedings Vol. 1756:
Interferometry: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

© SPIE. Terms of Use
Back to Top