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Proceedings Paper

Statistical analysis of phase-stepping digital speckle-pattern interferometry
Author(s): Wen Zheng
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Paper Abstract

This paper investigates the effect of partial speckle decorrelation due to the transverse component of the object displacement on the phase measurement using statistical optical theory. The theoretical values of statistical phase errors are derived under the in-plane and out-of-plane displacement sensitive arrangement when using the phase subtracting method. The selection of the optimum system parameters is also discussed. The theoretical and experimental results show that this phase extracting method is sensitive to speckled and additive noise.

Paper Details

Date Published: 5 February 1993
PDF: 9 pages
Proc. SPIE 1755, Interferometry: Techniques and Analysis, (5 February 1993); doi: 10.1117/12.140779
Show Author Affiliations
Wen Zheng, Guangzhou Univ. (China)

Published in SPIE Proceedings Vol. 1755:
Interferometry: Techniques and Analysis
Gordon M. Brown; Osuk Y. Kwon; Malgorzata Kujawinska; Graeme T. Reid, Editor(s)

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