Share Email Print

Proceedings Paper

Expert system for analysis of complicated fringe patterns
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The review of the advantages and disadvantages of analytical phase measurement methods of automatic fringe pattern analysis is given. The pros and cons for their applications due to the complexity of an interferogram, the accuracies required, and the type of a quantity measured are considered. The architecture of the system which enables the proper choice between Fourier transform method, temporal and spatial phase-shifting methods is described. The error considerations for these errors are given. The philosophy of the expert system which should apply the various image processing and phase-measuring possibilities in the most efficient way is presented.

Paper Details

Date Published: 5 February 1993
PDF: 6 pages
Proc. SPIE 1755, Interferometry: Techniques and Analysis, (5 February 1993); doi: 10.1117/12.140776
Show Author Affiliations
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 1755:
Interferometry: Techniques and Analysis
Gordon M. Brown; Osuk Y. Kwon; Malgorzata Kujawinska; Graeme T. Reid, Editor(s)

© SPIE. Terms of Use
Back to Top