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Proceedings Paper

Outgassing analyses performed during vacuum bakeout of components painted with Chemglaze Z306/9922
Author(s): James S. Dyer; Richard C. Benson; Terry E. Phillips; James J. Guregian
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Paper Abstract

Chemglaze Z306 flat black polyurethane paint on Chemglaze 9922 epoxy primer is the most predominantly used optically black coating on the MSX spacecraft. All MSX surfaces painted with Chemglaze Z306/9922 were baked at 90 - 100 degree(s)C under high vacuum to reduce the potential outgassing during ground operations and on-orbit. Analytical measurements have been performed to verify the bakeout efficiency, identify the outgassing products, and assist in quantitative predictions of on-orbit outgassing rates and their effects. The bakeout of the SPIRIT III telescope main baffle was monitored using a quartz crystal microbalance (QCM) and residual gas analyzers. The apparent outgassing rates of organic species decreased significantly during the bakeout. Gas chromatography/mass spectrometry (GC/MS) and FTIR analyses of cold trap samples collected at intervals during the bakeout were conducted in order to identify the outgassing species. The outgassing products at 100 degree(s)C of individual samples of G-10 fiberglass epoxy and Chemglaze Z306/9922 were analyzed using GC/MS to determine the source of the various species observed during the bakeout of the baffle. These analyses provide baseline data which will assist in the interpretation of contamination measurements (QCM, witness mirror film accumulations, and residual gas analyses) to be performed during SPIRIT III sensor integration and test.

Paper Details

Date Published: 18 December 1992
PDF: 18 pages
Proc. SPIE 1754, Optical System Contamination: Effects, Measurement, Control III, (18 December 1992); doi: 10.1117/12.140731
Show Author Affiliations
James S. Dyer, Utah State Univ. (United States)
Richard C. Benson, Johns Hopkins Univ. (United States)
Terry E. Phillips, Johns Hopkins Univ. (United States)
James J. Guregian, Sensor Systems Group (United States)

Published in SPIE Proceedings Vol. 1754:
Optical System Contamination: Effects, Measurement, Control III
A. Peter M. Glassford, Editor(s)

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