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Proceedings Paper

Reflective and transmissive scatter from ZnS and ZnSe samples
Author(s): John G. Kepros
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Paper Abstract

Scatter measurements were performed on one sample each of ZnSe and ZnS (sometimes called 'cleartrans') in 5.0 degree intervals from 5.0 degrees to 180 degrees (an additional point, 3.7 degrees from specular was also obtained). Two detectors were available: A battery powered Si detector, used in the voltage mode and chosen to match potential IR sources and a photomultiplier tube (PMT, used in the current mode), chosen to match a visible source such as a Xe arc lamp. Two sources were available. The first was an HeNe laser operating at 6328 Angstroms with a nominal power of 15 mW. The second was a Xe arc lamp with an input of 1000 watts. The lamp was used, alone, as a broadband source or it was used with an interference filter having peak transmission of 5000 Angstroms and bandwidth of 100 Angstroms. The resulting matrix of 12 tests characterizes the relative scatter from these two materials over a significant part of the visible spectrum and demonstrates the potential difficulties in comparing tests with differently convolving source-detection systems.

Paper Details

Date Published: 12 February 1993
PDF: 7 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140708
Show Author Affiliations
John G. Kepros, Lockheed Missiles & Space Co., Inc. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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