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Proceedings Paper

Retroreflections on a low-tech approach to the measurement of opposition effect
Author(s): Tod F. Schiff; John C. Stover; Daniel J. Wilson; B. D. Swimley; Mark E. Southwood; Donald R. Bjork
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Paper Abstract

This paper reviews a simple (economical) technique for measuring retro-scatter. Noise floors below 10-5 sr-1 have been achieved. The technique relies on a unique Stokes/Mueller method of characterizing sample polarization characteristics. Data is presented for several samples. This paper relies on material presented in the preceding two papers of this document.

Paper Details

Date Published: 12 February 1993
PDF: 7 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140707
Show Author Affiliations
Tod F. Schiff, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)
Daniel J. Wilson, TMA Technologies, Inc. (United States)
B. D. Swimley, TMA Technologies, Inc. (United States)
Mark E. Southwood, TMA Technologies, Inc. (United States)
Donald R. Bjork, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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