Share Email Print
cover

Proceedings Paper

Mueller matrix measurements of scattered light
Author(s): Tod F. Schiff; John C. Stover; B. D. Swimley; Donald R. Bjork
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper includes a very brief review of Stokes vectors and Mueller matrices. Matrix characteristics are reviewed for a number of different samples--i.e.: isotropic, anisotropic, diffuse, etc. Measurements are given for a number of different samples at both 633 and 1060 nm. This paper relies on hardware descriptions presented in the previous paper in this document.

Paper Details

Date Published: 12 February 1993
PDF: 9 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140706
Show Author Affiliations
Tod F. Schiff, TMA Technologies, Inc. (United States)
John C. Stover, TMA Technologies, Inc. (United States)
B. D. Swimley, TMA Technologies, Inc. (United States)
Donald R. Bjork, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top