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Proceedings Paper

Near specular measurements of integrated scatter
Author(s): James A. Bender; Timothy D. Henning; Marvin L. Bernt
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Paper Abstract

Measurement of integrated scatter near the specular beam is an excellent way to qualify optics and optical coatings that are used in imaging systems. This paper reviews an instrument design to measure Total Integrated Scatter (TIS) over the range from 0.05 degree(s) to 3.0 degree(s) from specular. The measurement scheme utilizes an integrating plate instead of an integrating sphere.

Paper Details

Date Published: 12 February 1993
PDF: 6 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140696
Show Author Affiliations
James A. Bender, TMA Technologies, Inc. (United States)
Timothy D. Henning, TMA Technologies, Inc. (United States)
Marvin L. Bernt, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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