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Proceedings Paper

Very near specular measurement via incident angle scaling
Author(s): John C. Stover; Marvin L. Bernt
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Paper Abstract

A technique for calculating scatter to within a few thousandths of a degree from specular is discussed. Results are given for several mirrors.

Paper Details

Date Published: 12 February 1993
PDF: 6 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140695
Show Author Affiliations
John C. Stover, TMA Technologies, Inc. (United States)
Marvin L. Bernt, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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