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Proceedings Paper

Wavelength dependence of scatter in chemical-vapor-deposited SiC
Author(s): Jitendra Singh Goela; Michael A. Pickering; Raymond L. Taylor
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Paper Abstract

Bidirectional reflectance distribution function has been measured on highly polished uncoated and silver coated samples of CVD SiC in the wavelength range 0.325-10.6 microns to determine the dependence of scatter as a function of wavelength. From these data, total integrated scatter, the power spectral density as function of spatial frequency, and the root mean square surface roughness were calculated. The results indicate that the uncoated CVD-SiC scatter topographically (i.e., follow the lambda exp -4 scaling law) in the wavelength region, 0.325-1.06 micron but not in the region, 1.06-10.6 microns. At 10.6 microns, CVD-SiC exhibits unusually large surface scatter which can be significantly improved by coating CVD-SiC with a thin layer of silver.

Paper Details

Date Published: 12 February 1993
PDF: 13 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140693
Show Author Affiliations
Jitendra Singh Goela, Morton Advanced Materials (United States)
Michael A. Pickering, Morton Advanced Materials (United States)
Raymond L. Taylor, Morton Advanced Materials (United States)

Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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