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Proceedings Paper

Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces
Author(s): Sheldon M. Smith
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Paper Abstract

The manner in which diffraction can increase the reflectance measured from very rough surfaces is shown by observations of diffracted light within the instrument profile of a far-IR reflectometer system. A correction to the calibration signal based on numerical integration of the diffracted part of the instrument profile is described. Diffraction correction factors as large as 2.94 have been found with small optics at long wavelength (630 microns). The effect of diffraction on diffuse reflectance measurements of a very rough perfect reflector is shown at wavelengths from 56 to 200 microns.

Paper Details

Date Published: 12 February 1993
PDF: 12 pages
Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); doi: 10.1117/12.140690
Show Author Affiliations
Sheldon M. Smith, Sterling Software, Inc. and NASA Ames Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1753:
Stray Radiation in Optical Systems II
Robert P. Breault, Editor(s)

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