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Proceedings Paper

Precision of the calibration of the AXAF engineering test article mirrors
Author(s): Daniel A. Schwartz; George Chartas; John P. Hughes; Edwin M. Kellogg; Ping Zhao
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Paper Abstract

Measurements of the VETA encircled energies have been performed at 5 energies within 16 radii ranging from 0.05 to 200 arcseconds. We report here on the analysis of the accuracy of those measurements. A common 'error tree' structure applies, and we present representative numbers for the larger terms. At 0.277, 1.5, and 2.07 keV, and for radii of 3 arcsec and larger, our measurements have estimated 1 sigma errors of 0.6 to 1.5 percent. Effects of measurement statistics and of the VETA test mount limit the accuracy at smaller angles, and modulation by the counter window support structure together with the imperfect position repeatability limit the accuracy for the 0.93 and 2.3 keV energies. We expect to mitigate these limitations when calibrating the complete AXAF flight mirror assembly.

Paper Details

Date Published: 21 January 1993
PDF: 20 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140610
Show Author Affiliations
Daniel A. Schwartz, Smithsonian Astrophysical Observatory (United States)
George Chartas, Smithsonian Astrophysical Observatory (United States)
John P. Hughes, Smithsonian Astrophysical Observatory (United States)
Edwin M. Kellogg, Smithsonian Astrophysical Observatory (United States)
Ping Zhao, Smithsonian Astrophysical Observatory (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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