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Proceedings Paper

Optical constants from mirror reflectivities measured at synchrotrons
Author(s): Richard L. Blake; Jeffrey C. Davis; T. H. Burbine; Dale E. Graessle; Eric M. Gullikson
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Paper Abstract

Improved mirror reflectivity measurement techniques have been introduced to permit more accurate determinations of optical constants delta and beta in the complex index of refraction n = 1 - delta - i(beta) over the energy range 50 to 5000 eV. When the density has been determined by X-ray or other means, one can calculate the real and imaginary parts, f-prime and f-double prime, of the complex atomic scattering factor f = f(o) + f-prime + if-double prime from delta and beta. Preliminary results are given for the Ni LIII edge around 852 eV, and the Au M edge region from 2150 to 3500 eV. Since these are the first experimental evaluations of delta for these element edges, they are compared with appropriate reservations to semiempirical tabulations. There is much potential for this technique applied to synchrotron sources.

Paper Details

Date Published: 21 January 1993
PDF: 4 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140603
Show Author Affiliations
Richard L. Blake, Los Alamos National Lab. (United States)
Jeffrey C. Davis, Los Alamos National Lab. (United States)
T. H. Burbine, Smithsonian Astrophysical Observatory (United States)
Dale E. Graessle, Smithsonian Astrophysical Observatory (United States)
Eric M. Gullikson, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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