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Proceedings Paper

VETA-I x-ray detection system
Author(s): William A. Podgorski; Kathryn A. Flanagan; Mark D. Freeman; Richard E. Goddard; Edwin M. Kellogg; Timothy J. Norton; J. Paul Ouellette; Adrian G. Roy; Daniel A. Schwartz
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Paper Abstract

The alignment and X-ray imaging performance of the Advanced X-ray Astrophysics Facility (AXAF) Verification Engineering Test Article-I(VETA-I) was measured by the VETA-I X-Ray Detection System (VXDS). The VXDS was based on the X-ray detection system utilized in the AXAF Technology Mirror Assembly (TMA) program, upgraded to meet the more stringent requirements of the VETA-I test program. The VXDS includes two types of X-ray detectors: (1) a High Resolution Imager (HRI) which provides X-ray imaging capabilities; and (2) sealed and flow proportional counters which, in conjunction with apertures of various types and precision translation stages, provide the most accurate measurement of VETA-I performance. Herein we give an overview of the VXDS hardware including X-ray detectors, translation stages, apertures, proportional counters and flow counter gas supply system and associated electronics. We also describe the installation of the VXDS into the Marshall Space Flight Central (MSFC) X-Ray Calibration Facility (XRCF). We discuss in detail the design and performance of those elements of the VXDS which have not been discussed elsewhere; translation systems, flow counter gas supply system, apertures and thermal monitoring system.

Paper Details

Date Published: 21 January 1993
PDF: 15 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140590
Show Author Affiliations
William A. Podgorski, Smithsonian Astrophysical Observatory (United States)
Kathryn A. Flanagan, Smithsonian Astrophysical Observatory (United States)
Mark D. Freeman, Smithsonian Astrophysical Observatory (United States)
Richard E. Goddard, Smithsonian Astrophysical Observatory (United States)
Edwin M. Kellogg, Smithsonian Astrophysical Observatory (United States)
Timothy J. Norton, Smithsonian Astrophysical Observatory (United States)
J. Paul Ouellette, Smithsonian Astrophysical Observatory (United States)
Adrian G. Roy, Smithsonian Astrophysical Observatory (United States)
Daniel A. Schwartz, Smithsonian Astrophysical Observatory (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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